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Aberration correction in scanning transmission electron microscopy (STEM) enables an atomic-scale probe size of ∼0.1nm at a low accelerating voltage of 80kV that avoids knock-on damage in materials including light elements such as oxygen. We used this advanced method of microscopy to directly observe atomic columns in a (Bi,Pb) 2 Sr 2 Ca 2 Cu 3 O 10+δ (Bi-2223)...
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