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Assessing the local ideality factor m is a useful approach to identify performance-limiting mechanisms in solar cells. Typically, m is extracted from the current-voltage curve of a completed solar cell and plotted as a function of voltage. In this study, m is extracted from photoluminescence measurements of the effective carrier lifetime and plotted against the minority carrier concentration Δn or...
Heavily doped regions (in particular emitters) in silicon wafer solar cells are a major source of recombination which limits the open-circuit voltage, the short-circuit current and hence the efficiency. These regions are typically characterized by the emitter saturation current density, which is commonly calculated from the plot of the inverse effective lifetime (corrected for Auger recombination)...
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