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CeO 2 buffer layers were deposited on IBAD-Gd 2 Zr 2 O 7 tapes by the pulsed laser deposition (PLD) method and were investigated especially in terms of the thickness dependence on the crystal grain alignment. The film thickness was varied from 10 to 1200 nm. The grain alignment of the CeO 2 layer on an IBAD tape was drastically improved with increasing its thickness...
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