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@font-face {font-family: "Arial";}p.MsoNormal, li.MsoNormal, div. MsoNormal {margin: 0in 0in 0.0001pt; font-size: 12pt; font-family: "Times New Roman";}div. Section1 {page: Section1;} A finite element model has been created to quantify the thermal fatigue damage of the CPV die attach. Simulations are used to compare to results of empirical thermal fatigue equations originally developed...
A finite-element (FEM) model has been created to quantify the thermal fatigue damage of the concentrating photovoltaic (CPV) die attach. Simulations are used to compare the results of empirical thermal fatigue equations that have originally been developed for accelerated chamber cycling. While the empirical equations show promise when extrapolated to the lower temperature cycles characteristic of...
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