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Despite much technological interest, a standardized test method for the quantification of the cohesive properties of thin films has not yet been established. In addition, for thin brittle coatings on compliant substrates, which are of great interest for flexible electronic devices, conventional techniques cannot be applied. In this work we use a synchrotron-based technique to determine biaxial stress–strain...
Fragmentation and buckling of Ta layers with thicknesses of 50, 100, and 200nm on polyimide substrates was studied by in situ light microscopy and synchrotron analysis. Buckling indicates the presence of compressive stress, which cannot be explained exclusively by a Poisson ratio mismatch. We extended the classical shear lag model and derived a rigorous analytical solution for the biaxial stress field...
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