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In the last decade, we have developed a set of experimental techniques for in-house X-ray diffraction measurements under high-temperature (up to about 2300K) and high-pressure (up to 10GPa and 1500K, up to 100GPa and 700K) conditions, electron energy-loss and Auger measurements for surface electronic structure measurements at high-temperature (up to about 1800K), and electrical resistance measurements...
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