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Scan based transition delay fault (TDF) tests are generally applied in the launch-on-capture (LOC) mode because the scan enable control signal broadcast to all flip-flops on the die is expensive to implement as a fast switching signal needed to support at-speed launch-on-shift (LOS) tests. However, there is mounting evidence that even when applied at much slower speeds, LOS tests often detect a significant...
Recent studies indicate that a significant number of very large delay faults that increase circuit path delays several fold, remain difficult to detect and are only discovered by very carefully crafted and comprehensive two-pattern tests, e.g. cell aware tests. A likely source of such large delays in CMOS is stuck-open faults. These can sometimes still allow the circuit to reach the correct logic...
Hazards have been known to have the potential to invalidate tests for stuck-open faults in CMOS circuits. In this paper we show that hazards can also predictably allow the detection of stuck-open faults that may be undetectable by traditional TDF launch-on-capture (LOC) scan delay tests. Importantly, the detected open faults are not redundant, and can in fact be activated in normal functional operation...
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