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P-doped silicon rich oxide (SRO) /silicon dioxide (SiO2) superlattices, deposited by sputtering method under different substrate temperatures, were treated using conventional furnace annealing or rapid thermal annealing (RTA). Raman and X-ray diffraction (XRD) were used to characterize the samples. Results show larger nanocrystal size is formed by furnace annealing than by RTA. High crystallinity...
Bismuth based oxides, formed by bismuth oxide doped with the yttrium or lanthanum element, have been widely studied for their high ionic conductivities and other applicable properties. Recently, they were used as buffer layers for film superconductors and have shown a promising future. But the detailed information of their structures and properties has not been fully understood. In this work, the...
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