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In this paper, the hot-electron-induced degradation in voltage-controlled oscillator (VCO) is investigated. A current starved VCO is designed in 0.25 mum CMOS process to verify the VCO gain degradation due to hot-carrier effects. The loop dynamics, phase noise and output clock jitter of a second order PLL are studied. The loop parameters, i.e., damping factor and natural frequency, phase noise and...
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