Search results for: Kai Yin
IEEE Transactions on Instrumentation and Measurement > 2012 > 61 > 1 > 17 - 25
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 3 > 555 - 565
IEEE Transactions on Instrumentation and Measurement > 2012 > 61 > 1 > 17 - 25
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 3 > 555 - 565