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Inter-turn short-circuit faults that occur inside stator coils are difficult to cope with compared to terminal short-circuit faults. A general analytical model for inter-turn short-circuit faults is developed that employs a novel T-type equivalent circuit. When this model is used to investigate the impact of inter-turn short-circuit faults in PM machines with fractional-slot concentrated windings...
This work proposes a power supply noise reduction technique for at-speed testing in the broadcast-based test compression environment. The core technology is the X-slice creation technique, it comprises the scan-chain skew-insertion hardware and the skew configuration generation algorithm. With the created X-slices, the efficiency of X-slice filling to lower the launch cycle switching activity is improved...
This paper presents PHS-Fill, an ATPG technique that reduces(1) power supply noise for scan-based at-speed testing, and(2) test data volume in a Huffman coding based test compression environment. PHS-Fill first identifies the preferred Huffman symbols; these symbols correspond to the test pattern templates that improve test compression and reduces power supply noise at the same time. ATPG then biases...
Yield loss caused by excessive power supply noise has become a serious problem in at-speed scan testing. Although X-filling techniques are available to reduce the launch cycle switching activity, their performance may not be satisfactory in the linear-decompressor-based test compression environment. This work is the first to solve this problem by proposing a novel integrated ATPG scheme that efficiently...
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