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We have designed and fabricated a terahertz full-polarimetry instrument, based on control of terahertz polarization in a gas-plasma source, and fast measurement of polarization direction and chirality of the terahertz field in the time-domain without using any external polarizers. We will present details on this new experimental technique including synchronization and calibration of the measurement...
We experimentally show that continuously changing polarity of an elliptically-polarized terahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ∼1 μm.
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