Search results for: J. Wang
IEEE Electron Device Letters > 2007 > 28 > 11 > 984 - 986
Materials Characterization > 2002 > 48 > 2-3 > 215-220
IEEE Electron Device Letters > 2007 > 28 > 11 > 984 - 986
Materials Characterization > 2002 > 48 > 2-3 > 215-220