The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
As the wide usage of FPGA( Field Programming Gate Array ) in military and aerospace fields, the reliability of FPGA becomes more and more significant. CLB (Configurable Logic Block) is the main logic unit of FPGA, which can realize combinational logic and sequential logic. Dynamic burn-in test is one of the most important tests in reliability assessment of FPGA, which can make potential defects of...
FPGA is widely used in military and aerospace applications and FPGA testing is the most effective means to ensure the reliability of them. Interconnect Resources testing is one of the most important parts of FPGA testing since that most of the faults occur on Interconnect Resources. FPGA needs to be configured as specified circuits before being tested and conventional HDL-based configuration can not...
FPGAs are widely adopted in many application domains and the higher accuracy requirement of FPGA makes the diagnostics and prognostics techniques of FPGA-based system is becoming increasingly important. This paper takes the stuck-at fault of look-up table in programmable logic blocks as a research object and presents the diagnostic method based on the Built-in Self Test. Example is provided for the...
Obsolescence makes equipments supporting and maintaining hard and costly. It hurts the equipments reliability seriously. In the past decades, electronic technology has developed very rapidly causing components (and particularly the FPGAs) to have a shortened life span. So the problem of electronic component obsolescence in complex electronic or long life systems such as aircraft submarines and ships...
In this paper, we present a test pattern generation method based on fault injection for logic elements of FPGAs (Field Programmable Gate Arrays). This method is able to perform fault diagnosis for stuck-at-0 and stuck-at-1 faults, which can locate logic resource faults in the logic elements of FPGA. We use EP2C8Q208C8N's LE (Logic Element) of Altera as the object to generate the test pattern, work...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.