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Accurate and rapid realization of transmission line fault location is of great significance to power system stability. In order to solve the T type transmission line fault location problem, the wave mode transform and wavelet transform are used to get the wavelet modulus maxima, and then determine line overvoltage wave arrival time, at last calculate the fault location according to the fault location...
Built-in self-repair (BISR) techniques are widely used to enhance the yield of embedded random access memories (RAMs). Fault-location ability of test algorithms executed by a BISR circuit has heavy impact on the repair efficiency of the BISR circuit. This paper proposes a defect-aware BISR (DABISR) scheme for single-port RAMs (SPRAMs) and multi-port RAMs (MPRAMs) in system chips. Multiple RAMs can...
Embedded memory plays an important role in modern system-on-chip designs. However, the reliability issue of embedded memories becomes more and more critical with the shrinking of transistor feature size. This paper proposes a programmable online/off-line built-in self-test (BIST) scheme for random access memories (RAMs) with error correction code (ECC). The BIST scheme can be used for performing production...
Multi-port random access memory (MPRAM) is widely used in system-on-chip (SOC) designs. This paper presents two defect-location algorithms (DLAs) for locating the bridge defects between word-lines and bit-lines in a MPRAM. Once faulty rows or faulty columns are detected by a typical test for functional faults, the DLAs can be used to locate bridge defects between bit-lines or word-lines if such bridge...
Diagnosis techniques are important for memory yield improvement. This paper presents an efficient diagnosis scheme for RAMs. The diagnosis scheme is composed of three March-based algorithms. A March-15N algorithm is used for locating and partially diagnosing faults of bit-oriented or word-oriented memories, where N represents the address number. Then a 3N March-like algorithm is used for locating...
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