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We present a design technique for providing test access to 3D core-based SOCs under constraints on the number of TSVs and the TAM bitwidth. The associated optimization method is based on a combination of integer linear programming, LP-relaxation, and randomized rounding. Simulation results are presented for the ITC 02 SOC Test Benchmarks and the test times are compared to that obtained when methods...
Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Such a modular testing approach can also be used for emerging three-dimensional integrated circuits based on through-silicon vias (TSVs). Core-based SOCs based on 3D IC technology are being advocated as a means to continue technology...
The impact of process variations on circuit timing increases rapidly as technology scales. Consequently, it is important to consider timing variations at the early stages of circuit designs. Conventional high level synthesis relies on the worst-case delay analysis to guide the design space exploration, however, such worst-case timing analysis can results in overly conservative designs with pessimistic...
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