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Over four decades of R&D has delivered near-universal automation of test generation for digital hardware. In contrast, software testing has limited automation and hence suffers from low test quality and high cost. One of the important reasons for this difference is that hardware ATPG is fault oriented. We note that the notion of a mutation in software testing is very similar to the notion of a...
Increasing yield is important, especially for nano-scale technologies. Also, pipelines are an important aspect of many SoC architectures. In this paper we present new approaches to improve the yield and yield/area of pipeline architectures by using (1) an appropriate number of redundant copies for each module, and (2) sufficient steering logic resources. We present an optimal algorithm of time complexity...
Error tolerance formally captures the notion that - for a wide variety of applications including audio, video, graphics, and wireless communications - a defective chip that produces erroneous values at its outputs may be acceptable, provided the errors are of certain types and their severities are within application-specified thresholds. All previous research on error tolerance has focused on identifying...
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