Search results for: Yu Shan
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 799 - 801
IEEE Electron Device Letters > 2017 > 38 > 7 > 835 - 838
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 475 - 478
2016 IEEE SENSORS > 1 - 3