Search results for: Shanshan Liu
IEEE Transactions on Reliability > 2017 > 66 > 2 > 518 - 528
Microelectronics Reliability > 2017 > 73 > C > 92-96
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 5 > 1593 - 1600
Microelectronics Reliability > 2017 > 69 > C > 126-129
Microelectronics Reliability > 2016 > 63 > C > 278-283
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 4 > 1603 - 1606
IEEE Transactions on Reliability > 2015 > 64 > 2 > 596 - 602