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A biaxially textured buffer layer of LaZrO (LZO) was continuously grown on Ni-5-at%W (NiW) tapes using a reel-to-reel DC reactive sputtering technique. X-ray diffraction measurements revealed that the LZO layer deposited at water vapor partial pressures of 2.5×10−2 Pa and the temperature of 800 °C are biaxially textured with the misorientation as low as 4.7°. AFM measurements show that the layer’s...
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