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Growing test data volume and excessive test power consumption in scan-based testing are both serious concerns for the semiconductor industry. Various test data compression (TDC) schemes and low-power X-filling techniques were proposed to address the above problems. These methods, however, exploit the very same ??don't-care?? bits in the test cubes to achieve different objectives and hence may contradict...
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test data compression (TDC) schemes and low-power X-filling techniques were proposed to address the above problems. These methods, however, exploit the very same ldquodon't-carerdquo bits in the test cubes to achieve different...
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