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The low scanning speed for atomic force microscopies (AFMs) restricts its further applications, where fast scanning or real-time imaging is required. In some cases (e.g. real-time imaging), repeated scanning tasks on the same area are expected. For this specific application, an on-line scanning time allocation based variable speed scanning method is proposed here to enhance the scanning speed. Specifically,...
Atomic force microscopes (AFMs) are usually utilized for nano-scale imaging. Usually, the slide loading the samples and the stage of the AFM cannot be placed completely parallel with the motion plane of the piezoelectric actuator due to the manual operation and machining errors, which leads to the variation of imaging brightness (or height) along the slope and makes the relative topography unrealistic...
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