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We present a camera-based technique for the local determination of reverse saturation current densities of highly doped regions in silicon wafers utilizing photoconductance-calibrated photoluminescence (PL) imaging at different illumination intensities. We apply this approach to float zone silicon (Si) samples with textured surfaces and a homogeneous phosphorous...
Since 15 years lock-in thermography (LIT) is used to investigate solar cells and modules. While LIT was used at the beginning only for shunt detection, meanwhile special LIT-techniques have been developed to image the minority carrier lifetime, also on wafers, the monochromatic cell efficiency, the local series resistance, the ideality factor, or the physical properties of breakdown sites. A general...
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