Search results for: Rui Zhang
Journal of Shanghai Jiaotong University (Science) > 2019 > 24 > 4 > 490-495
Microelectronics Reliability > 2017 > 76-77 > C > 87-91
IEEE Communications Magazine > 2016 > 54 > 5 > 36 - 42
2015 IEEE International Reliability Physics Symposium > XT.7.1 - XT.7.6
IEEE Transactions on Nanotechnology > 2015 > 14 > 2 > 205 - 209