Search results for: Fang Chen
IEEE Electron Device Letters > 2017 > 38 > 5 > 677 - 680
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 12 > 3308 - 3314
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1606 - 1612
IEEE Transactions on Instrumentation and Measurement > 2011 > 60 > 1 > 176 - 185