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The rapid development of modern electronic devices and products has proposed a great demand for the continuous scaling down in the dimension of solder joints and interconnect pitches in packaging; accordingly the current density in solder interconnects gets higher and higher. The higher current density can easily result in electromigration (EM) which has been regarded as a serious reliability issue...
The morphological evolution of Cu6Sn5 grains formed at the interfaces of “Sn-3.0Ag-0.5Cu/Poly-crystal Cu (PC-Cu)” and “Sn-3.0Ag-0.5Cu/Single crystal Cu (SC-Cu)” under different reflow conditions was investigated. Reflow experiments were performed at different peak temperatures of 230, 260 and 290°C corresponding to the dwelling time of 20s, 60s and 600s, respectively. The results show that Cu6Sn5...
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