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At-speed testing is essential for VLSI ICs implemented in nanometer technologies, operating at high clock speeds. Traditional scan based methodologies can be used for at-speed testing using a transition delay fault model. There are two common techniques to launch the transition-launch-on-shift (LOS) and launch-on-capture (LOC). LOS gives better fault coverage than LOC, but the main drawback of LOS...
Delay faults are frequently encountered in nanometer technologies. Therefore, it is critical to detect these faults during factory test. Testing for a delay fault requires the application of a pair of test vectors in an at-speed manner. To maximize the delay fault detection capability, it is desired that the vectors in this pair are independent. Independent vector pairs cannot always be applied to...
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