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For long lifetime and high reliability products, it is difficult to obtain failure time data in a short time period. Hence, Accelerated Degradation Testing (ADT) is presented to deal with the cases that no failure time data could be obtained but degradation data of the primary parameter of the product are available. At present, there are mainly two ways to predict product life and reliability by ADT:...
For long lifetime and high reliability products, it is difficult to obtain failure time data in a short time period. Hence, Accelerated Degradation Testing (ADT) is presented to deal with the cases that few or no failure time data could be obtained but degradation data of the primary parameter of the product are available. Step-Stress ADT (SSADT) is commonly used for the advantage that it needs only...
Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super Luminescent Diode (SLD). Previous works on CSADT use deterministic function to describe the product degradation and they are not considered adequately. This paper proposes a CSADT data analysis method based on time series method. It proposes a...
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