Search results for: Manoj Kumar
Microelectronics Reliability > 2014 > 54 > 11 > 2570-2577
IEEE Transactions on Electromagnetic Compatibility > 2014 > 56 > 6 > 1666 - 1673
IET Micro & Nano Letters > 2014 > 9 > 11 > 792 - 796
IEEE Electron Device Letters > 2012 > 33 > 8 > 1180 - 1182