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An Fe-34.5Mn-0.04C steel has been processed by cold rolling and annealing to prepare samples with a lamellar structure, a recrystallized grain structure and a composite structure of layers of recovered and recrystallized structures. For the recrystallized grain structure and the lamellar structure, the flow stress has been analyzed by applying Hall-Petch formulations. For the composite structure,...
The gate-all-around (GAA) silicon nanowire transistor (SNWT) is considered as one of the best candidates for ultimately scaled CMOS devices. This paper discusses the process impact on nanowire LER/LWR, as well as the impact of 2D nanowire LER on performance variation and degradation. And it is found that SNWTs, which is immune to channel RDF(random dopant fluctuation), exhibit SDE-RDF which is enhanced...
We report the effects of crystallization temperature on the phase transformation behavior of NiTi thin films. With increasing crystallization temperature, the film stress during phase transformations drops sharply. Smaller grains were found as crystallization temperatures increased. These data suggest that, along with thermal stress, microstructure contributes to the phase transformation behavior,...
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