The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The effects of leakage-biased voltage (VLB) levels are investigated in this paper, which are set for failure-mode identification on the final fault diagnostic measurement in transmission line pulse (TLP) testing. To identify the effect on electrostatic discharge (ESD) robustness, three types of MOSFET components were employed; namely, low-voltage n-channel MOSFET (LVnMOS) (5 V/0.6 μm), high-voltage...
Impacts of zapping-voltage step (ΔV) setting on the final fault-diagnostic measurement of transmission-line pulse (TLP) testing are presented in this paper. In order to identify the influence on electrostatic-discharge (ESD) immunity evaluation, three kinds of MOSFET devices are employed, which are the LV nMOSFET (0.6-µm/5-V), HV nMOSFET and HV pMOSFET (1.8-µm/12-V) technologies devices, respectively...
N-channel MOSFETs are often applied to the input/output ports as electrostatic discharge (ESD) protection elements, usually in the form of multi-finger placement. However, the non-uniform turned-on situation always occurred, therefore these sub-nMOSFETs can't conduct-on simultaneously. The ESD current will be passed through a few turned-on MOSFETs. It was due to the RBulk resistance of parasitic bipolar...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.