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Head-in-Pillow (HiP) defect is a common issue in the Ball Grid Array (BGA) assembly. The defect is caused by several factors, individually or jointly, which includes warpage, misalignment, oxidation of the BGA ball, solder paste oxidation barrier capability, ect. The influence of before-reflow misalignment on HiP ratio(%HiP) has been studied. However, before-reflow misalignment can't describe HiP...
In this work, ball grid array (BGA) Sn-Pb solder joints on Co-P (4±0.5 at.%P and 8±0.8 at.%P) and Cu substrates were investigated to clarify the effects of interfacial reaction and morphology on the shear strength of the joints during thermal cycling. The interfacial intermetallic compounds (IMCs) in the solder joints were observed by back-scattered electron scanning electron microscopy. The composition...
Head-in-Pillow (HiP) defect is a common issue in the Ball Grid Array (BGA) assembly. The defect is caused by several factors, individually or jointly, which includes warpage, misalignment, oxidation of the BGA ball, solder paste oxidation barrier capability, ect. The influence of before-reflow misalignment on HiP ratio(%HiP) has been studied. However, before-reflow misalignment can't describe HiP...
In this work, ball grid array (BGA) Sn-Pb solder joints on Co-P (4±0.5 at.%P and 8±0.8 at.%P) and Cu substrates were investigated to clarify the effects of interfacial reaction and morphology on the shear strength of the joints during thermal cycling. The interfacial intermetallic compounds (IMCs) in the solder joints were observed by back-scattered electron scanning electron microscopy. The composition...
TC test is very important for solder joint reliability, but the test time for TC test is very long, normally it cost about 2 months. In order to shorten TC test time, many researchers study the new test method to replace traditional TC test, such as bending fatigue test. However, there's still some limit for this field study. Considering the actual user condition, the final product not only experience...
The solder ball pitch of BGA packages in mass production now is normally above 0.5 mm. To fulfill the future demand of package miniaturization, the 0.4 mm ultra fine pitch BGA solder joint was researched in this paper. The solder volume shrinkage along with the ball pitch decrease was found to affect the joint microstructure, which could be characterized in two aspects: the Sn dendrites in bulk solder...
Therepsilare many kinds of bending test conditions according to different control modes: displacement control, force control and strain control. In our paper, strain-controlled bending test was chosen, since the lifetime and failure modes were more sensitive relating to different loading strain range and strain rate. ANSYS was used to simulate the bending test to predict board level solder joint reliability...
In this paper, the behavior of BGA solder joints microstructures was studied as a function of Ni doping in SAC solder. Three kinds of solder compositions were selected including Sn3.0Ag0.5Cu, Sn1.0Ag0.5Cu and Sn1.0Ag0.5Cu0.02Ni to value the influence the effect of Ni doping, OSP and Au/Ni pad was employed on the PCB side. Emphasis was placed on studying the effect of low level doping with Ni on the...
The solder joints reliability of electronic packages during board level drop impact is a great concern for semiconductor manufacturers. Many researchers have adopted numerical simulation to investigate the drop performance of electronic package because it is fast and cost-effective. However, the solder balls, which are recognized as vital parts for the integrity of solder joints and the overall function...
In tins paper, the effect of a new type of pad structure in which the copper pad is half etched with OSP surface finish on board level thermal cycle reliability of BGA is evaluated comparing conventional flat pad with ENIG surface finish. The test data is presented, including resulting Weibull analyses indicating characteristic life. The solder joint with flat pad Ni/Au surface finish has a little...
In order to study the effect of rare earth doping on temperature cycle (TC) and drop reliabilities of the SnAgCu solder joints, cerium (Ce) was added to Sn2.5AgO.5Cu solder by the amount of 300, 500, 1000 ppm, respectively. Solder joints were formed. TC and drop tests were conducted. Results show that 500 ppm Ce addition has the least influence on TC reliability of the solder joints, while less or...
RF-MEMS is one of the most potential applications for MEMS products. Eutectic solder wafer bonding is one of the attractive methods for RF-MEMS wafer level packaging. A process of gold-tin hermetical wafer bonding was developed in SAIT, Korean. Different UBM systems and thin films of gold-tin were deposited on cap wafer, RF-MEMS device wafer and substrate wafer (if needed). The bonding was performed...
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