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Aluminum thin films grown on silicon by free evaporation were studied by grazing incidence X-ray diffraction and atomic force microscopy techniques. The behavior of the films during current flowing, the induced changes by large periods of current applied, as well as the temporal evolution of the deformation due to thermal expansion because of the Joule effect, were studied. We explain the degradation...
Surfaces of CdTe thin films were studied by atomic force microscopy (AFM). Samples were prepared—using Corning glass as a substrate — by a modification of the close-spaced vapour transport (CSVT) technique with 400°C as the substrate temperature. Roughness measurements of the surface of the microcrystals that are present in the films show a flatness better than in the case of CdTe layers grown by...
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