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Epitaxial La0.9Sr0.1MnO3 thin films were crystallized using post-annealing after deposited at room temperature, and the effect of sputtering pressure on the structural, magnetic and electrical properties was investigated. It is interesting to note that the out-of-plane lattice parameter decreases with decreasing sputtering pressure, which is attributed to the reduction of Mn3+/Mn4+ ratio. Differing...
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