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This paper provides: 1) a very brief motivation and technological trend data to show why hard and soft errors are expected to be of increasing concern in the future; 2) a summary review of chip-level error tolerance practices today-with a brief reference to IBM's POWER6 and POWER7 designs; 3) open research challenges and current solution approaches of promise, based on published literature; and 4)...
Single-thread performance, reliability and power efficiency are critical design challenges of future multicore systems. Although point solutions have been proposed to address these issues, a more fundamental change to the fabric of multicore systems is necessary to seamlessly combat these challenges. Towards this end, this paper proposes CoreGenesis, a dynamically adaptive multiprocessor fabric that...
With growing semiconductor integration, the reliability of individual transistors is expected to rapidly decline in future technology generations. In such a scenario, processors would need to be equipped with fault tolerance mechanisms to tolerate in-field silicon defects. Periodic online testing is a popular technique to detect such failures; however, it tends to impose a heavy testing penalty. In...
Increases in peak current draw and reductions in the operating voltages of processors continue to amplify the importance of dealing with voltage fluctuations in processors. One approach suggested has been to not only react to these fluctuations but also attempt to eliminate future occurrences of these fluctuations by dynamically modifying the executing program. This paper investigates the potential...
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