Search results for: Xiaofei Wang
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 763 - 772
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 2 > 280 - 291
2012 IEEE International Reliability Physics Symposium (IRPS) > 2F.5.1 - 2F.5.6