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Recently, selective encoding of scan slices is proposed to compress test data. This encoding technique, unlike many other compression techniques encoding all the bits, only encodes the target-symbol by specifying single bit index and copying group data. In this paper, we propose an extended selective encoding which presents two new techniques: flexible grouping strategy, X bits exploitation and filling...
A simple test structure is proposed for accurately extracting the substrate network parameters of a radio-frequency MOSFET with deep n-well implantation from two-port measurements. The test structure with the source, drain, and gate terminals all connected together is used as port one, while the bulk terminal as port two, making the substrate network distinctly accessible in measurements. A methodology...
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