Wyniki wyszukiwania dla: Hong-yu Li
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 142 - 148
IEEE Electron Device Letters > 2013 > 34 > 1 > 18 - 20
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 142 - 148
IEEE Electron Device Letters > 2013 > 34 > 1 > 18 - 20