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There is a recent trend and growing popularity of using the technique of light pulsation for achieving the dimming control of light-emitting diodes. However, it is found that such a dimming control technique can result in a significant power loss in terms of luminous efficacy. This contradicts the original motive of energy saving through illumination dimming. Total energy consumed for lighting is...
An investigation on the recovery characteristics of p-MOSFET with ultra-thin decoupled plasma nitrided gate oxide under negative bias temperature (NBT) stress is presented. The electron trapping assisted NBTI recovery mechanism is proposed with new evidence on the dependence of recovery rate on source/drain voltage, i.e. gate oxide field. Further, the findings about the different gate current behaviour...
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