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The micromagnetic properties of a Ni film in a Cu/Ni crossed-wedge on Cu(001) are investigated by a combination of photoelectron emission microscopy and X-ray magnetic circular dichroism. Two spin-reorientation transitions (SRT) from in-plane to perpendicular to the film plane and back to in-plane were observed with increasing Ni thickness. Whereas no clear Cu thickness dependence of the former SRT...
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