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Laser Fault Injection (LFI) is a powerful method of introducing faults into a specific area of an integrated circuit. Because the minimum spot size of the laser spot is physically bounded, many recent publications investigate down to which technology node individual transistors can be targeted. In contrast, we develop a novel attack that is applicable even when a large number of gates is affected...
Laser Fault Injection (LFI) is one of the most powerful methods of inducing a fault as it allows targeting only specific areas down to single transistors. The downside compared to non-invasive methods like introducing clock glitches is the largely increased search space. An exhaustive search through all parameters including dimensions for correct timing, intensity, or length might not be not feasible...
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