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A rugged landscape for high‐performance electromechanical responses is reported on p. 3170 by Lane W. Martin and co‐workers. The cover image shows a high‐resolution atomic force microscopy image of the complex surface structure of a highly strained BiFeO3 thin film. The presence of several structural variants in these films gives rise to exotic electric‐field‐induced responses and electromechanical...
The presence of a variety of structural variants in BiFeO3 thin films give rise to exotic electric‐field‐induced responses and resulting electromechanical responses as large as 5%. Using high‐resolution X‐ray diffraction and scanning‐probe‐microscopy‐based studies the numerous phases present at the phase boundaries are identified and an intermediate monoclinic phase, in addition to the previously...
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