Search results for: X. Wu
IEEE Electron Device Letters > 2012 > 33 > 6 > 890 - 892
2011 International Reliability Physics Symposium > 3A.1.1 - 3A.1.8
IEEE Electron Device Letters > 2011 > 32 > 6 > 716 - 718
IEEE Journal of Solid-State Circuits > 2008 > 43 > 11 > 2396 - 2403