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HEV is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive / active thermal cycle ageing must be evaluated. Authors present first results on ageing and failure modes for a 75V/350A MOSFET module from a low voltage / cycled DC current test bench. Bond wires are used for electrical connections between dies and between dies...
The crack and delamination of solder joints between base plates and DCB substrates of power modules is one of the most frequently encountered failure mode and studied in literature. In this paper we present numerical effects of solder meniscus design in solder lifetime prediction. Especially, we show the effect of singular points, which appear in the border edges or corners of DCB or solder joints...
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