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We characterize free carrier effects in silicon waveguides due to electronic non-idealities such as dielectric fixed charges and interface states, independently considering SiO2, SiNx and Al2O3 cladding layers. These effects are shown to impact both the passive and active properties of silicon waveguides.
Photonic systems based on microring resonators have a fundamental constraint given by the strict relationship among free spectral range, total quality factor , and resonator size, intrinsically making filter spacing, photonic lifetime, and footprint interdependent. Here, we break this paradigm employing CMOS-compatible silicon-on-insulator photonic molecules based on coupled multiple...
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