Search results for: Shi Yu
IEEE Design & Test > 2016 > 33 > 2 > 9 - 16
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 3 > 443 - 453
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 1 > 165 - 170