The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper reports a new scalable behavioral modeling technique for novel nano crossbar ESD protection structures using Verilog-A language. Accurate models for nano crossbar ESD protection structures with different sizes were developed, which were validated by circuit level simulation and transmission line pulsing ESD measurement.
This paper reviews recent advances in 3D on-chip electrostatic discharge (ESD) protection design for integrated circuits (IC). Traditional ESD protection relies on PN-junction-based structures, which have inherent disadvantages including fixed ESD triggering and parasitic effects. New ESD protection mechanisms and structures, including nano crystal dots and nano crossbar concepts, provide alternative...
To optimize performance of dense array concentrator photovoltaic (CPV) system, we have acquired real time flux distribution pattern using novel optical scanner and then fed the data to computational modeling algorithm for the sake of designing optimized configuration of dense-array layout. As a case study, a prototype of non-imaging planar concentrator (NIPC) capable of producing reasonable uniform...
This paper reports on the application of heuristic algorithms for one-dimensional bin-packing problems in solving current mismatch of concentrator photovoltaic (CPV) arrays that is caused by non-uniform solar flux distribution. As a case study, actual flux profile for a non-imaging planar concentrator (NIPC) is measured based on CPV cells' location in a dense-array. Then, forty-four solar cells are...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.