Search results for: Lauri Sydanheimo
Journal of Electrostatics > 2016 > 79 > C > 38-44
Journal of Electrostatics > 2015 > 77 > C > 174-181
Microelectronics Reliability > 2010 > 50 > 12 > 2001-2011
Journal of Electrostatics > 2016 > 79 > C > 38-44
Journal of Electrostatics > 2015 > 77 > C > 174-181
Microelectronics Reliability > 2010 > 50 > 12 > 2001-2011