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Because of their temperature sensitivity, investigation of thermal effects on electrolytic aluminum capacitors is required using ageing tests. In general, a reliability assessment methodology for these components is carried out during ageing tests, which reports dimensions and weight characterizations, electrical parameter measurement (capacitance and equivalents series resistance (ESR)) and identification...
Because of switching conditions, the SiC MOSFET (Silicon Carbide MOSFET) always remains a critical device in static converters. Its reliability is still a challenge which requires more investigation. This paper studies the accelerated aging effect on the conducted electromagnetic-interference evolution in the N Channel SiC MOSFETs. Simulations are carried out by modifying parameters of the SiC transistor...
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