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The extended x-ray absorption fine structure (EXAFS) and the Atomic force microscopy (AFM) have been used to study the local structural information of Ni nanoparticles implanted into glass. Three different concentrations of nickel nanoparticle samples were fabricated by metal vapor vacuum arc (MEVVA) source on amorphous silicon dioxide substrate at room temperature. With the increase of Ni ion implantation,...
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